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SPIE Proceedings [SPIE Photometry: Selected Papers from the 8th and 9th CIS Conferences - Moscow, Russia (Tuesday 24 November 1992)] CIS Selected Papers: Photometry - <title>New device for measuring residual stress in optical elements</title>

SPIE Proceedings [SPIE Photometry: Selected Papers from the 8th and 9th CIS Conferences - Moscow, Russia (Tuesday 24 November 1992)] CIS Selected Papers: Photometry - New device for measuring residual stress in optical elements

Sahnovsky, M. Y.; Semiv, O. A.; Skolozdra, S. V.; Serbunov, J. M.; Timochko, B. M.; Ushakov, Leonid S.
  • 作者Sahnovsky, M. Y.; Semiv, O. A.; Skolozdra, S. V.; Serbunov, J. M.; Timochko, B. M.; Ushakov, Leonid S.
  • 卷第2161卷
  • 印刷ISSN0277-786X
  • 文件大小207.41KB
  • 发表时间1993
  • DOI10.1117/12.166374
  • 页码158-160
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