SPIE Proceedings [SPIE Photometry: Selected Papers from the 8th and 9th CIS Conferences - Moscow, Russia (Tuesday 24 November 1992)] CIS Selected Papers: Photometry - New device for measuring residual stress in optical elements
Sahnovsky, M. Y.; Semiv, O. A.; Skolozdra, S. V.; Serbunov, J. M.; Timochko, B. M.; Ushakov, Leonid S.
- 作者Sahnovsky, M. Y.; Semiv, O. A.; Skolozdra, S. V.; Serbunov, J. M.; Timochko, B. M.; Ushakov, Leonid S.
- 卷第2161卷
- 印刷ISSN0277-786X
- 文件大小207.41KB
- 发表时间1993
- DOI10.1117/12.166374
- 页码158-160