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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - <title>Optical vibration measurement of mechatronics devices</title>

SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Optical vibration measurement of mechatronics devices

Yanabe, Shigeo; Zhu, Li

作者Yanabe, Shigeo; Zhu, Li
卷第2101卷
印刷ISSN0277-786X
文件大小229.77KB
发表时间1993
DOI10.1117/12.156346
页码1025-1030

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