SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Interferometry VI: Techniques and Analysis - New technique for testing large optical flat
- 作者Wang, Qingyun; Kwon, Osuk Y.; Brown, Gordon M.; Chen, Jinbang; Zhu, Rihong; Kujawinska, Malgorzata; Chen, Lei; Zhang, Yiguang
- 卷第2003卷
- 印刷ISSN0277-786X
- 文件大小440.11KB
- 发表时间1993
- DOI10.1117/12.165477
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