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A STM study of the effects of the ion incident angle and energy on surface damage induced by Ar+ bombardment of HOPG

A STM study of the effects of the ion incident angle and energy on surface damage induced by Ar+ bombardment of HOPG

T. Li; B.V. King; R.J. MacDonald; G.F. Cotterill; D.J. O'Connor; Q. Yang
  • 作者T. Li; B.V. King; R.J. MacDonald; G.F. Cotterill; D.J. O'Connor; Q. Yang
  • 卷第312卷
  • 期第3期
  • 印刷ISSN0039-6028
  • 文件大小1688.73KB
  • 发表时间1994
  • DOI10.1016/0039-6028(94)90731-5
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