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[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - Reduced scan shift: a new testing method for sequential circuits

[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - Reduced scan shift: a new testing method for sequential circuits

Higami, Y.; Kajihara, S.; Kinoshita, K.
  • 作者Higami, Y.; Kajihara, S.; Kinoshita, K.
  • 文件大小618.43KB
  • 发表时间1994
  • DOI10.1109/test.1994.528007
  • 页码624-630
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