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[IEEE 52nd Annual Device Research Conference - Boulder, CO (June 20-22, 1994)] 52nd Annual Device Research Conference - Direct gate-controlled NDR characteristics in surface tunnel transistor

[IEEE 52nd Annual Device Research Conference - Boulder, CO (June 20-22, 1994)] 52nd Annual Device Research Conference - Direct gate-controlled NDR characteristics in surface tunnel transistor

Uemura, T.; Baba, T.

作者Uemura, T.; Baba, T.
文件大小173.29KB
发表时间1994
DOI10.1109/drc.1994.1009418
页码65-66

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