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[IEEE 1994 Proceedings. 44th Electronic Components and Technology Conference - Washington, DC, USA (1-4 May 1994)] 1994 Proceedings. 44th Electronic Components and Technology Conference - Capacitance monitoring while flex testing

[IEEE 1994 Proceedings. 44th Electronic Components and Technology Conference - Washington, DC, USA (1-4 May 1994)] 1994 Proceedings. 44th Electronic Components and Technology Conference - Capacitance monitoring while flex testing

Bergenthal, J.; Prymak, J.D.

作者Bergenthal, J.; Prymak, J.D.
文件大小699.09KB
发表时间1994
DOI10.1109/ectc.1994.367528
页码854-860

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