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- 期刊名称Physical Review C
- 作者Boger, J.; Alexander, John M.; Auger, G.; Elmaani, A.; Kox, S.; Lacey, Roy A.; Narayanan, A.; Kaplan, Morton; Moses, D. J.; McMahan, M. A.; DeYoung, P. A.; Gelderloos, C. J.; Gilfoyle, G.
- 卷第49卷
- 期第3期
- 印刷ISSN0556-2813
- 电子ISSN1089-490X
- 文件大小693.13KB
- 发表时间1994-3-1
- DOI10.1103/PhysRevC.49.1576
- 页码1576-1586
ErratumT. P. Dykstra; L. M. Black; Arthur Hawkins; J. A. Chucka; B. E. Brown; J. H. Jensen; R. W. Goss; C. L. Fitch; Frank W. Hussey; H. A. Reiley; Eral B. Tussing; J. B. R. Dickey; K. W. Lauer; T. E. Odland · 1941
ACKNOWLEDGEMENTSD. J. C. SHEARMAN EDITOR; I. J. COOK; R. J. FITCH; G. G. JAMIESON; R. D. JOHNSON; J. T. LABROOY; D. Z. LUBOWSKI; I. C. ROBERTS-THOMSON; J. ST JOHN; 0. W. WIEBKIN · 1990
Sectional notesM. R. Ensign; G. R. Townsend; D. R. Porter; T. J. Talbert; J. B. R. Dickey; Robert Schmidt; C. L. Fitch; Frank W. Hussey; Julian C. Miller · 1934
Production and perception rules underlying visual patterns: effects of symmetry and hierarchyWestphal-Fitch, G.; Huber, L.; Gomez, J. C.; Fitch, W. T. · Philosophical Transactions of the Royal Society B: Biological Sciences · 2012
The electric strength of air — IVWhitehead, J. B.; Fitch, T. T. · Proceedings of the American Institute of Electrical Engineers · 1913
The Electric Strength of Air-IVWhitehead, J. B.; Fitch, T. T. · Transactions of the American Institute of Electrical Engineers · 1913
Invasive gastric candidiasisT. F. Pugh; S. J. Fitch · 1986
Sectional notesC. L. Fitch; Frank W. Hussey; H. A. Reiley; Eral B. Tussing; J. B. R. Dickey; K. W. Lauer; T. E. Odland · 1941
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992