![SPIE Proceedings [SPIE Orlando '91, Orlando, FL - Orlando, FL (Monday 1 April 1991)] Surveillance Technologies - <title>Optical delay tester</title>]()
SPIE Proceedings [SPIE Orlando '91, Orlando, FL - Orlando, FL (Monday 1 April 1991)] Surveillance Technologies - <title>Optical delay tester</title>Wakana, Shin-ichi; Nagai, Toshiaki; Hama, Soichi; Goto, Yoshiro; Gowrinathan, Sankaran; Mataloni, Sr., Raymond J.; Schwartz, Stanley J. · 1991