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SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Fiber Optic and Laser Sensors XI - <title>White-light interferometric spectral analysis for displacement sensing</title>

SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Fiber Optic and Laser Sensors XI - White-light interferometric spectral analysis for displacement sensing

Podoleanu, Adrian Gh.; Taplin, Stephen R.; Webb, David J.; Jackson, David A.; DePaula, Ramon P.
  • 作者Podoleanu, Adrian Gh.; Taplin, Stephen R.; Webb, David J.; Jackson, David A.; DePaula, Ramon P.
  • 卷第2070卷
  • 印刷ISSN0277-786X
  • 文件大小398.55KB
  • 发表时间1994
  • DOI10.1117/12.169894
  • 页码92-102
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