[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - A radiation induced failure mechanism for power semiconductor devices

• 作者Obreja, V.V.N.
• 文件大小302.95KB
• 发表时间1995
• DOI10.1109/smicnd.1995.494900
• 页码211-214