Write/erase degradation in source side injection flash EEPROM's: characterization techniques and wearout mechanisms
- 作者Wellekens, D.; Van Houdt, J.; Faraone, L.; Groeseneken, G.; Maes, H.E.
- 卷第42卷
- 期第11期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小728.07KB
- 发表时间1995
- DOI10.1109/16.469408
- 页码1992-1998
Table of ContentsAnesthesiology · 2012
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Topical AnalgesicsMcCleane, Gary · Anesthesiology Clinics · 2007