[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Test synthesis in the behavioral domain
Papachristou, C.; Carletta, J.
- 作者Papachristou, C.; Carletta, J.
- 文件大小902.07KB
- 发表时间1995
- DOI10.1109/test.1995.529899
- 页码693-702