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[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Yield learning via functional test data

[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - Yield learning via functional test data

Young-Jun Kwon, ; Walker, D.M.H.

作者Young-Jun Kwon, ; Walker, D.M.H.
文件大小1010.73KB
发表时间1995
DOI10.1109/TEST.1995.529891
页码626-635

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