[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Statistics for matching

Pergoot, A.; Graindourze, B.; Janssens, E.; Bastos, J.; Steyaert, M.; Kinget, P.; Roovers, R.; Sansen, W.

作者Pergoot, A.; Graindourze, B.; Janssens, E.; Bastos, J.; Steyaert, M.; Kinget, P.; Roovers, R.; Sansen, W.
文件大小298.87KB
发表时间1995
DOI10.1109/icmts.1995.513971
页码193-197

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