Growth and morphology of Ni/Cu(100) ultrathin films: An in situ study using scanning tunneling microscopy
- 期刊名称Physical Review B
- 作者Shen, J.; Giergiel, J.; Kirschner, J.
- 卷第52卷
- 期第11期
- 印刷ISSN0163-1829
- 电子ISSN1095-3795
- 文件大小1703.00KB
- 发表时间1995-9-15
- DOI10.1103/PhysRevB.52.8454
- 页码8454-8460
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