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Interpretation of the diffraction profile resulting from strain relaxation in epilayers

Interpretation of the diffraction profile resulting from strain relaxation in epilayers

P. Kidd; P. F. Fewster; N. L. Andrew
  • 作者P. Kidd; P. F. Fewster; N. L. Andrew
  • 文件大小571.48KB
  • 发表时间1995
  • DOI10.1088/0022-3727/28/4A/026
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