SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and Extreme Ultraviolet Optics - X-ray characterization of an XMM mandrel at the European Synchrotron Radiation Facility
Gondoin, Philippe; Freund, Andreas K.; Gougeon, Samuel; de Chambure, Daniel; van Katwijk, Kees; Labergerie, Danielle R.; Lienert, Ulrich; Schulz, N.; Hoover, Richard B.; Walker, Jr., Arthur B. C.
- 作者Gondoin, Philippe; Freund, Andreas K.; Gougeon, Samuel; de Chambure, Daniel; van Katwijk, Kees; Labergerie, Danielle R.; Lienert, Ulrich; Schulz, N.; Hoover, Richard B.; Walker, Jr., Arthur B. C.
- 卷第2515卷
- 印刷ISSN0277-786X
- 文件大小601.06KB
- 发表时间1995
- DOI10.1117/12.212578
- 页码70-83