Positive charge trapping in thin gate oxides of MOS capacitors during constant current and voltage fowler-nordheim stress
- 作者Piyas Samanta; C. K. Sarkar
- 卷第151卷
- 期第2期
- 印刷ISSN1862-6319
- 文件大小569.51KB
- 发表时间1995
- DOI10.1002/pssa.2211510227
- 页码501-511
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