$SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - <title>Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction</title>$

SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction

Rubish, V. M.; Yurkin, I.; Malesh, V.; Fedelesh, Vassyl'; Trunov, M. L.; Semak, D.; Svechnikov, Sergey V.; Valakh, Mikhail Y.

作者Rubish, V. M.; Yurkin, I.; Malesh, V.; Fedelesh, Vassyl'; Trunov, M. L.; Semak, D.; Svechnikov, Sergey V.; Valakh, Mikhail Y.
卷第2648卷
印刷ISSN0277-786X
文件大小155.42KB
发表时间1995
DOI10.1117/12.226221
页码530-536

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