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[IEEE 1996 54th Annual Device Research Conference Digest - Santa Barbara, CA, USA (24-26 June 1996)] 1996 54th Annual Device Research Conference Digest - High field drift velocity of 2DEG in Si/SiGe heterostructures as determined by magnetoresistance techniques

[IEEE 1996 54th Annual Device Research Conference Digest - Santa Barbara, CA, USA (24-26 June 1996)] 1996 54th Annual Device Research Conference Digest - High field drift velocity of 2DEG in Si/SiGe heterostructures as determined by magnetoresistance techniques

Madhavi, S.; Venkataraman, V.; Liu, C.W.; Sturm, J.C.

作者Madhavi, S.; Venkataraman, V.; Liu, C.W.; Sturm, J.C.
文件大小147.79KB
发表时间1996
DOI10.1109/DRC.1996.546302
页码26-27

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