Correlation between structural, optical and electrical properties of μc-Si films
- 作者R. Krankenhagen; M. Schmidt; S. Grebner; M. Poschenrieder; W. Henrion; I. Sieber; S. Koynov; R. Schwarz
- 印刷ISSN0022-3093
- 文件大小280.85KB
- 发表时间1996
- DOI10.1016/0022-3093(96)00085-3
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