Structure determination of Si(111)3 × 3Sb surface by X-ray diffraction
- 作者S. Nakatani; Y. Kuwahara; T. Takahashi; M. Aono
- 印刷ISSN0039-6028
- 文件大小278.88KB
- 发表时间1996
- DOI10.1016/0039-6028(96)00059-3
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