Quantitative surface analysis by Auger and x-ray photoelectron spectroscopy
I.S. Tilinin; A. Jablonski; W.S.M. Werner
- 作者I.S. Tilinin; A. Jablonski; W.S.M. Werner
- 卷第52卷
- 期第4期
- 印刷ISSN0079-6816
- 文件大小8494.69KB
- 发表时间1996
- DOI10.1016/0079-6816(96)00008-1
- 页码193-335