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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Influence of die attachment on MOS transistor matching

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Influence of die attachment on MOS transistor matching

Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W.

作者Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W.
文件大小535.74KB
发表时间1996
DOI10.1109/ICMTS.1996.535617
页码27-31

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