[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - CASS case study
- 作者Luster, B.T.; Teshiba, M.A.
- 文件大小723.97KB
- 发表时间1996
- DOI10.1109/autest.1996.547670
- 页码8-16
同作者推荐
[IEEE 2009 1st Asia Symposium on Quality Electronic Design (ASQED 2009) - Kuala Lumpur, Malaysia (2009.07.15-2009.07.16)] 2009 1st Asia Symposium on Quality Electronic Design - Area-effective programmable FSM-based MBIST for synchronous SRAMNoor, Nur Qamarina Mohd; Saparon, Azilah; Yusof, Yusrina; Adnan, Mahmud · 2009
[IEEE Applications (ISIEA 2009) - Kuala Lumpur, Malaysia (2009.10.4-2009.10.6)] 2009 IEEE Symposium on Industrial Electronics & Applications - An overview of microcode-based and FSM-based programmable memory built-in self test (MBIST) controller for coupling fault detectionMohd Noor, Nur Qamarina; Saparon, Azilah; Yusof, Yusrina · 2009