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[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Deterministic test pattern reproduction by a counter

[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Deterministic test pattern reproduction by a counter

Kagaris, D.; Tragoudas, S.; Majumdar, A.

作者Kagaris, D.; Tragoudas, S.; Majumdar, A.
文件大小600.07KB
发表时间1996
DOI10.1109/edtc.1996.494125
页码37-41

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