[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Test structures for automated contactless inline wafer inspection
- 作者Satya, A.V.S.
- 文件大小342.00KB
- 发表时间1996
- DOI10.1109/icmts.1996.535665
- 页码311-313
Mechanism for Radiation Lethality in <i>M. Radiodurans</i>Kitayama, Shigeru; Matsuyama, Akira · International Journal of Radiation Biology · 1971
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Loss of characteristic radiation resistance by mutation of Micrococcus radioduransShigeru Kitayama; Akira Matsuyama · 1975
Genome Multiplicity and Radiation Resistance in Micrococcus radiodurans1HARSOJO, ; KITAYAMA, Shigeru; MATSUYAMA, Akira · The Journal of Biochemistry · 1981
Effects of protein or polysaccharides on radiosensitization with NaCl.KITAYAMA, Shigeru; CHEN, Su-Jen SHIH; MATSUYAMA, Akira · Agricultural and Biological Chemistry · 1982