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Role of silicon surface in the removal of point defects in ultrashallow junctions

Role of silicon surface in the removal of point defects in ultrashallow junctions

Sultan, A.; Banerjee, S.; List, S.; Rodder, M.
  • 期刊名称Applied Physics Letters
  • 作者Sultan, A.; Banerjee, S.; List, S.; Rodder, M.
  • 卷第69卷
  • 期第15期
  • 印刷ISSN0003-6951
  • 文件大小557.83KB
  • 发表时间1996
  • DOI10.1063/1.117136
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