SPIE Proceedings [SPIE MOEMS-MEMS 2006 Micro and Nanofabrication - San Jose, CA (Saturday 21 January 2006)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V - Modeling and analysis of MEMS-based resonant sensor actuated by bent beam thermal actuatorHassanpour, Pezhman; Tanner, Danelle M.; Ramesham, Rajeshuni; Cleghorn, William L.; Esmailzadeh, Ebrahim; Mills, James K. · 2006

[ASME ASME 2015 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2015 13th International Conference on Nanochannels, Microchannels, and Minichannels - San Francisco, California, USA (Monday 6 July 2015)] Volume 3: Advanced Fabrication and Manufacturing; Emerging Technology Frontiers; Energy, Health and Water- Applications of Nano-, Micro- and Mini-Scale Devices; MEMS and NEMS; Technology Update Talks; Thermal Management Using Micro Channels, Jets, Sprays - Mechanical Shock Reliability Analysis and Multiphysics Modeling of MEMS Accelerometers in Harsh EnvironmentsLall, Pradeep; Kothari, Nakul; Glover, Jessica · 2015

Effective relational dynamicsHöhn, Philipp A · Journal of Physics: Conference Series · 2012

Symmetries in Science XVSchuch, Dieter; Ramek, Michael · Journal of Physics: Conference Series · 2012

Review of Fricke gel dosimetersSchreiner, L J · Journal of Physics: Conference Series · 2004

Algorithmic causetsBolognesi, Tommaso · Journal of Physics: Conference Series · 2011

V-A was the keyWeinberg, Steven · Journal of Physics: Conference Series · 2009

Sudarshan: Seven Science QuestsWalser, R M; Valanju, A P; Valanju, P M · Journal of Physics: Conference Series · 2009

Neutrino physics overviewValle, J W F · Journal of Physics: Conference Series · 2006

Stochastic gravity: beyond semiclassical gravityVerdaguer, E · Journal of Physics: Conference Series · 2007