[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Analysis of thermally-enhanced SOIC packages
Guenin, B.M.; Chowdhury, A.; Groover, R.; Derian, E.J.
- 作者Guenin, B.M.; Chowdhury, A.; Groover, R.; Derian, E.J.
- 文件大小920.26KB
- 发表时间1996
- DOI10.1109/stherm.1996.545085
- 页码1-13