Computing the discrepancy with applications to supersampling patterns
Dobkin, David P.; Eppstein, David; Mitchell, Don P.
- 期刊名称ACM Transactions on Graphics
- 作者Dobkin, David P.; Eppstein, David; Mitchell, Don P.
- 卷第15卷
- 期第4期
- 印刷ISSN0730-0301
- 文件大小484.34KB
- 发表时间1996-10-1
- DOI10.1145/234535.234536
- 页码354-376