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[IEEE 17th International Symposium on Discharges and Electrical Insulation in Vacuum - Berkeley, CA, USA (21-26 July 1996)] Proceedings of 17th International Symposium on Discharges and Electrical Insulation in Vacuum - Circuit modelling of a vacuum gap during breakdown

[IEEE 17th International Symposium on Discharges and Electrical Insulation in Vacuum - Berkeley, CA, USA (21-26 July 1996)] Proceedings of 17th International Symposium on Discharges and Electrical Insulation in Vacuum - Circuit modelling of a vacuum gap during breakdown

Djogo, G.; Cross, J.D.
  • 作者Djogo, G.; Cross, J.D.
  • 卷第1卷
  • 文件大小673.20KB
  • 发表时间1996
  • DOI10.1109/deiv.1996.545323
  • 页码65-71
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