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SPIE Proceedings [SPIE Photonics West '96 - San Jose, CA (Saturday 27 January 1996)] Lasers as Tools for Manufacturing of Durable Goods and Microelectronics - <title>Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor</title>

SPIE Proceedings [SPIE Photonics West '96 - San Jose, CA (Saturday 27 January 1996)] Lasers as Tools for Manufacturing of Durable Goods and Microelectronics - Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor

Pepper, David M.; Dunning, Gilmore J.; Mitchell, Phillip V.; McCahon, Stephen W.; Klein, Marvin B.; O'Meara, Thomas R.; Dubowski, Jan J.; Mazumder, Jyotirmoy; Migliore, Leonard R.; Roychoudhuri, Chandrasekhar; Schaeffer, Ronald D.
  • 作者Pepper, David M.; Dunning, Gilmore J.; Mitchell, Phillip V.; McCahon, Stephen W.; Klein, Marvin B.; O'Meara, Thomas R.; Dubowski, Jan J.; Mazumder, Jyotirmoy; Migliore, Leonard R.; Roychoudhuri, Chandrasekhar; Schaeffer, Ronald D.
  • 卷第2703卷
  • 印刷ISSN0277-786X
  • 文件大小763.77KB
  • 发表时间1996
  • DOI10.1117/12.237768
  • 页码91-102
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