SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Laser Interferometry VIII: Techniques and Analysis - Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)
Patorski, Krzysztof; Olszak, Artur G.; Kujawinska, Malgorzata; Pryputniewicz, Ryszard J.; Takeda, Mitsuo
- 作者Patorski, Krzysztof; Olszak, Artur G.; Kujawinska, Malgorzata; Pryputniewicz, Ryszard J.; Takeda, Mitsuo
- 卷第2860卷
- 印刷ISSN0277-786X
- 文件大小530.70KB
- 发表时间1996
- DOI10.1117/12.276312
- 页码256-262