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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Vision Systems: New Image Processing Techniques - <title>Automatic defect detection</title>

SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Vision Systems: New Image Processing Techniques - Automatic defect detection

Daillant, Guylaine; Micollet, Dominique; Paindavoine, Michel; Refregier, Philippe
  • 作者Daillant, Guylaine; Micollet, Dominique; Paindavoine, Michel; Refregier, Philippe
  • 卷第2785卷
  • 印刷ISSN0277-786X
  • 文件大小901.22KB
  • 发表时间1996
  • DOI10.1117/12.248533
  • 页码117-127
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