SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Vision Systems: Sensors, Sensor Systems, and Components - Optoelectronic/image processing module for enhanced fringe pattern acquisition and analysis
Dymny, Grzegorz; Kujawinska, Malgorzata; Loffeld, Otmar
- 作者Dymny, Grzegorz; Kujawinska, Malgorzata; Loffeld, Otmar
- 卷第2784卷
- 印刷ISSN0277-786X
- 文件大小725.25KB
- 发表时间1996
- DOI10.1117/12.248519
- 页码111-117