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SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Uzhgorod, Ukraine (Monday 30 September 1996)] Material Science and Material Properties for Infrared Optoelectronics - <title>PbSnSe-on-Si: material and IR-device properties</title>

SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Uzhgorod, Ukraine (Monday 30 September 1996)] Material Science and Material Properties for Infrared Optoelectronics - PbSnSe-on-Si: material and IR-device properties

Zogg, Hans; Fach, Alexander; John, Joachim; Mueller, Peter; Paglino, Carmine; Tiwari, A. N.; Sizov, Fiodor F.; Tetyorkin, Vladimir V.
  • 作者Zogg, Hans; Fach, Alexander; John, Joachim; Mueller, Peter; Paglino, Carmine; Tiwari, A. N.; Sizov, Fiodor F.; Tetyorkin, Vladimir V.
  • 卷第3182卷
  • 印刷ISSN0277-786X
  • 文件大小1110.34KB
  • 发表时间1997
  • DOI10.1117/12.280428
  • 页码26-29
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