![SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, USA (Monday 5 May 2014)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV - Reporting NETD: why measurement techniques matter]()
SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, USA (Monday 5 May 2014)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV - Reporting NETD: why measurement techniques matterHolst, Gerald C.; Krapels, Keith A.; Ballard, Gary H.; Buford, James A.; Murrer, R. Lee; Rogers, Ryan K.; Edwards, W. Derrik; Waddle, Caleb E.; Dobbins, Christopher L.; Wood, Sam B. · 2014