[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - VLSI performance metric based on minimum TCAD simulations
- 作者Schrom, G.; De, V.; Selberherr, S.
- 文件大小307.43KB
- 发表时间1997
- DOI10.1109/sispad.1997.621327
- 页码25-28
同期刊推荐
Cognitive ControlHaykin, Simon; Fatemi, Mehdi; Setoodeh, Peyman; Xue, Yanbo · Proceedings of the IEEE · 2012
Color Management for Future Video SystemsWen, Senfar · Proceedings of the IEEE · 2013
Short-term load forecastingGross, G.; Galiana, F.D. · Proceedings of the IEEE · 1987
Receiver design for optical fiber systemsPersonick, S.D. · Proceedings of the IEEE · 1977
Energy detection of unknown deterministic signalsUrkowitz, H. · Proceedings of the IEEE · 1967
Continuous speech recognition by statistical methodsJelinek, F. · Proceedings of the IEEE · 1976
A proposed p-n junction cathodeGeppert, D.V. · Proceedings of the IEEE · 1966
A high temperature Luneburg lensGunderson, L.C.; Kauffman, K.F. · Proceedings of the IEEE · 1968