Inverse analysis for magnetic field source searching in thin film conductor
Midorikawa, Y.; Ogawa, J.; Doi, T.; Hayano, S.; Saito, Y.
- 期刊名称IEEE Transactions on Magnetics
- 作者Midorikawa, Y.; Ogawa, J.; Doi, T.; Hayano, S.; Saito, Y.
- 卷第33卷
- 期第5期
- 印刷ISSN0018-9464
- 文件大小442.99KB
- 发表时间1997
- DOI10.1109/20.619645
- 页码4008-4010