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Direct observation of stacking fault tetrahedra in ZnSe/GaAs(001) pseudomorphic epilayers by weak beam dark-field transmission electron microscopy

Direct observation of stacking fault tetrahedra in ZnSe/GaAs(001) pseudomorphic epilayers by weak beam dark-field transmission electron microscopy

Fung, K. K.; Wang, N.; Sou, I. K.

期刊名称Applied Physics Letters
作者Fung, K. K.; Wang, N.; Sou, I. K.
卷第71卷
期第9期
印刷ISSN0003-6951
文件大小2337.82KB
发表时间1997
DOI10.1063/1.119858

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