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SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - <title>Application of polarimetry in optical computerized tomography of anisotropic media</title>

SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Application of polarimetry in optical computerized tomography of anisotropic media

Berezhna, S. Y.; Berezhnyi, I. V.; Krupych, O. M.; Vlokh, Orest G.; Pluta, Maksymilian; Wolinski, Tomasz R.
  • 作者Berezhna, S. Y.; Berezhnyi, I. V.; Krupych, O. M.; Vlokh, Orest G.; Pluta, Maksymilian; Wolinski, Tomasz R.
  • 卷第3094卷
  • 印刷ISSN0277-786X
  • 文件大小346.28KB
  • 发表时间1997
  • DOI10.1117/12.271811
  • 页码169-174
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