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Internal Stress Effect on the Temperature Dependence of the Dielectric and Lattice Constant in Sm-doped
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              Ceramics

Internal Stress Effect on the Temperature Dependence of the Dielectric and Lattice Constant in Sm-doped B a T i O 3 Ceramics

Park, Yung; Kim, Ho-Gi
  • 期刊名称Japanese Journal of Applied Physics
  • 作者Park, Yung; Kim, Ho-Gi
  • 卷第36卷
  • 印刷ISSN0021-4922
  • 电子ISSN1347-4065
  • 文件大小1112.63KB
  • 发表时间1997-6-15
  • DOI10.1143/jjap.36.3558
  • 页码3558-3563
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