TABLE OF CONTENTS
- 期刊名称Science and Engineering of Composite Materials
- 卷第6卷
- 期第2期
- 印刷ISSN0792-1233
- 电子ISSN2191-0359
- 文件大小74.41KB
- 发表时间1997-01
- DOI10.1515/SECM.1997.6.2.I
Ion irradiation effects in platinum oxide filmsF. Machalett; K. Gärtner; K. Edinger; M. Diegel · 2003
Visual Display Factors Contributing to Simulator SicknessHettinger, L. J.; Nolan, M. D.; Kennedy, R. S.; Berbaum, K. S.; Schnitzius, K. P.; Edinger, K. M. · Proceedings of the Human Factors and Ergonomics Society Annual Meeting · 1987
Piezoresistive SXM sensorsI. W. Rangelow; P. Grabiec; T. Gotszalk; K. Edinger · 2002
Mitteilungen aus verschiedenen biologischen GebietenTilly Edinger; W. Schnakenbeck; L. Nöth; Florian Heller; K. Hummel · 1935
BesprechungenAllbrecht Hase; W. Schnakenbeck; Walter Landauer; T. Edinger; Luntz; K. Henke; J. Gross; R. Hesse; W. Goetsch; P. Schulze; E. Zilsel; R. Courant; W. Westphal · 1926
Biologische MitteilungenTilly Edinger; K. Friederichs; Lajos Székely; E. Feige · 1931
Biologische MitteilungenK. Henke; W. Blaustein; Senta Kipke; Tilly Edinger; E. Feige · 1931
BesprechungenJ. v. Kries; Strümpell; Specht; F. Hermann; K. Pfeiffer; Edinger · 1895
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992