Real-time Hall effect measurements of high critical currents epitaxial YBa2Cu3O7−x thin films
S.G. Zybtsev; V.I. Nizhankovskii; S.F. Kim
- 作者S.G. Zybtsev; V.I. Nizhankovskii; S.F. Kim
- 印刷ISSN0921-4534
- 文件大小141.32KB
- 发表时间1997
- DOI10.1016/s0921-4534(97)00771-5
- 页码1203-1204