Measurement and modelling of sensitivity and noise of MOS magnetic field-effect transistors

• 作者Dirk Killat; Johannes v. Kluge; Frank Umbach; Werner Langheinrich; Richard Schmitz
• 卷第61卷
• 印刷ISSN0924-4247
• 文件大小710.33KB
• 发表时间1997
• DOI10.1016/s0924-4247(97)80286-5
• 页码346-351