SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Grazing Incidence and Multilayer X-Ray Optical Systems - AXAF HXDS germanium solid state detectors
McDermott, Walter C.; Kellogg, Edwin M.; Wargelin, Bradford J.; Evans, Ian N.; Vitek, S. A.; Tsiang, Eugene Y.; Schwartz, Daniel A.; Edgar, Richard J.; Kraft, Stefan; Scholze, Frank; Thornagel, R.; Ulm, Gerhard; Weisskopf, Martin C.; O'Dell, Stephen L.; Tennant, Allyn F.; Kolodziejczak, Jeffery J.; Zirnstein, C. G.; Hoover, Richard B.; Walker II, Arthur B. C.
- 作者McDermott, Walter C.; Kellogg, Edwin M.; Wargelin, Bradford J.; Evans, Ian N.; Vitek, S. A.; Tsiang, Eugene Y.; Schwartz, Daniel A.; Edgar, Richard J.; Kraft, Stefan; Scholze, Frank; Thornagel, R.; Ulm, Gerhard; Weisskopf, Martin C.; O'Dell, Stephen L.; Tennant, Allyn F.; Kolodziejczak, Jeffery J.; Zirnstein, C. G.; Hoover, Richard B.; Walker II, Arthur B. C.
- 卷第3113卷
- 印刷ISSN0277-786X
- 文件大小709.45KB
- 发表时间1997
- DOI10.1117/12.278888
- 页码535-543