Franz Edelman Award Papers || Reliability: Probabilistic Models and Statistical Methodsby Lawrence M. Leemis
Review by: U. Narayan Bhat
- 期刊名称Interfaces
- 作者Review by: U. Narayan Bhat
- 卷第27卷
- 期第1期
- 印刷ISSN0092-2102
- 电子ISSN1526-551X
- 文件大小421.64KB
- 发表时间1997-0402
- DOI10.2307/25062222
- 页码164-165