A single exposure reflection moiré interferometric technique for complete curvature analysis of bent plates
- 作者G. Subramanian; A. Subramanian
- 卷第33卷
- 期第1期
- 印刷ISSN0039-2103
- 电子ISSN1475-1305
- 文件大小859.54KB
- 发表时间1997
- DOI10.1111/j.1475-1305.1997.tb01027.x
- 页码3-8
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